Novel memory device

ABSTRACT

A circuit includes: writing a plurality of data words, each of which has a plurality of data bits, into respective bit cells of a memory device; in response to determining that not all the data bits of the plurality of data words are correctly written into the respective bit cells of the memory device, grouping the plurality of data words as a plurality of data word sets; and simultaneously rewriting a subset of data bits that were not correctly written into the respective bit cells of the memory device, wherein the subset of the data bits are contained in a respective one of the plurality of data word sets.

CROSS-REFERENCE TO RELATED APPLICATION

The present application claims priority to U.S. Provisional PatentApplication No. 62/616,985, filed on Jan. 12, 2018, which isincorporated by reference herein in its entirety.

BACKGROUND

Memory devices are commonly employed in many types of electronicdevices, such as computers, cell phones, tablets, data loggers, andnavigational equipment, just to name a few examples. In general, writeoperations may be used to store information as data bits in such amemory device. In some instances, there may be plural data words, eachof which includes plural data bits, which are configured to be writteninto respective memory bit cells of the memory device. Occasionally,respective write operations may fail. For example, one or more data bitsof the plural data words may not be correctly written to the configuredmemory bit cells. Such data bits are typically referred to as faileddata bits.

To remedy such failed data bits, techniques used in existing memorydevices typically rely on one or more iterations to rewrite the faileddata bits based on a unit of a single “word.” For example, the faileddata bits contained in a first word are rewritten into the respectivelyconfigured memory bit cells, the failed data bits contained in a secondword are rewritten into the respectively configured memory bit cells,and so on, which is time and power consuming. Thus, existing memorydevices and methods to store data bits are not entirely satisfactory.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that various features are not necessarily drawn to scale. In fact,the dimensions of the various features may be arbitrarily increased orreduced for clarity of discussion.

FIG. 1 illustrates an exemplary block diagram of a memory device, inaccordance with some embodiments.

FIG. 2A illustrates an exemplary schematic diagram of a portion of thememory device of FIG. 1, in accordance with some embodiments.

FIG. 2B illustrates an exemplary schematic diagram of another portion ofthe memory device of FIG. 1, in accordance with some embodiments.

FIG. 3 illustrates a flow chart of an exemplary method to operate thememory device of FIG. 1, in accordance with various embodiments.

FIG. 4 illustrates a block diagram of a computer system to perform themethod of FIG. 3, in accordance with some embodiments.

DETAILED DESCRIPTION

The following disclosure describes various exemplary embodiments forimplementing different features of the subject matter. Specific examplesof components and arrangements are described below to simplify thepresent disclosure. These are, of course, merely examples and are notintended to be limiting. For example, it will be understood that when anelement is referred to as being “connected to” or “coupled to” anotherelement, it may be directly connected to or coupled to the otherelement, or one or more intervening elements may be present.

The present disclosure provides various embodiments of a memory deviceincluding a control logic circuit that is configured to rewrite one ormore failed data bits into respectively configured memory bit cellsbased on a unit of data word group. In some embodiments, the controllogic circuit may initiate a grouping operation on a plurality of datawords, each of which includes a plurality of data bits, in response todetermining a presence of one or more failed data bits within such aplurality data words. For example, the control logic circuit isconfigured to group the plurality of data words, which have a firstnumber of data words, as a plurality of data word sets, which have asecond number of data word sets, wherein the second number is less thanthe first number. According to some embodiments, the control logiccircuit iteratively checks whether each of the data word sets containsany of the failed data bits, and if so, rewrites the failed data bit(s)into the configured memory bit cells.

In some embodiments, by rewriting the failed data bit(s) based on theunit of data word set instead of each single word, various advantagesmay be provided. For example, since in general, the number of faileddata bits compared to the total number of data bits of each word isrelatively low (e.g., about in the range of one part per million (ppm)),rewriting the failed data bits grouped in each data word set can be moreefficient in terms of time and power. Further, because of the moreefficient rewrite operation(s), a greater tolerance on errors is allowedfor the initial write operation. As such, the magnitude of an initialwrite signal applied to the memory bit cells of the disclosed memorydevice can be substantially reduced, which may advantageously improverespective endurances of the memory bit cells.

FIG. 1 illustrates a block diagram of an exemplary memory device 100, inaccordance with various embodiments of the present disclosure. As shown,the memory device 100 includes a control logic circuit 102, a pluralityof memory banks 104, 106, 108, and 110, and a buffer circuit 120.Although as shown in the illustrated embodiment of FIG. 1, the memorydevice 100 includes four memory banks 104 to 110, it is understood thatthe memory device 100 can include any desired number of memory bankswhile still remaining within the scope of the present disclosure.

In some embodiments, the control logic circuit 102, coupled to thememory banks 104 to 110, is configured to receive a plurality of datawords, each of which includes a plurality of data bits, though astandardized interface (not shown), and write such a plurality of datawords into respective memory bit cells of the memory banks 104 to 110.Further, when receiving the plurality of data words, the control logiccircuit 102 may also receive respective logical addresses of the databits of the plurality of data words. Based on the logical addresses, thecontrol logic circuit 102 may write each of the data bits of theplurality of data words into the respective memory bit cell across thememory banks 104 to 110 (i.e., writing the data bits of the plurality ofdata words into respective physical addresses). When one or more of thedata bits are not correctly written into the respective memory bit cellsat such configured addresses (hereinafter “failed data bits”), thecontrol logic circuit 102 may perform a grouping operation to rewritethe one or more failed data bits into the respective memory bit cellsusing a unit of data word group, as will be discussed in further detailbelow.

In some embodiments, the buffer circuit 120, typically referred to as acache memory, is coupled to the control logic circuit 102 and includes aplurality of non-volatile memory cells such as, for example, flashmemory cells, chalcogenide random access memory (C-RAM) cells, phasechange RAM (PC-RAM or PRAM) cells, programmable metallization cell RAM(PMC-RAM or PMCm) cells, ovonic unified memory (OUM) cells, resistanceRAM (RRAM) cells, ferroelectric memory (FeRAM) cells, etc., or volatilememory cells, for example, static RAM (SRAM) cells, dynamic RAM (DRAM)cells, etc. Such memory cells of the buffer circuits 120 may be formedas on-chip memory cells (i.e., formed on the same chip as memory banks104-110) or off-chip memory cells (i.e., formed on a different chip frommemory banks 104-110). In some embodiments, the control logic circuit102 may store various types of data in the buffer circuit 120, forexample, a mapping of the above-mentioned failed data bits, as will bediscussed below.

As mentioned above, each of the memory banks 104 to 110 includes arespective plurality of memory bit cells. In some embodiments, therespective plurality of memory bit cells are arranged in a column-rowconfiguration, wherein each memory bit cell is disposed at a respectiveintersection of a bit line (BL) that forms a column and a word line (WL)that forms a row. Further, each of the memory banks 104 to 110 includesa respective row selection circuit, a column selection circuit, and awrite driver. FIGS. 2A and 2B illustrate respective schematic diagramsof the memory banks 104 to 110, according to some embodiments.

Referring to FIG. 2A, the schematic diagrams of the memory banks 104 and106 are shown, respectively. The memory bank 104 includes memory bitcells 104-1, 104-2, 104-3, 104-4, 104-5, 104-6, 104-7, 104-8, 104-9,104-10, 104-11, 104-12, 104-13, 104-14, 104-15, and 104-16 that areformed as an array 104A, a row selection circuit (typically referred toas a row multiplexer circuit) 104RM, a column selection circuit(typically referred to as a column multiplexer circuit) 104CM, and awrite driver circuit 104WD. As will be discussed below, each of the rowselection circuit 104RM, and the column selection circuit 104CM includesa plurality of components that are coupled to corresponding memory bitcells through respective BL's or WL's. Although in the illustratedembodiment of FIG. 2A, the memory bank 104 has 16 memory bit cells, thememory array 104A of the memory bank 104 can have any desired number ofmemory bit cells while remaining within the scope of the presentdisclosure. Further, it is understood that FIG. 2A illustrates only anexemplary embodiment and the memory bank 102 can utilize other memorycircuits known in the art, e.g., sensing amplifiers, pre-chargingcircuits, etc., while remaining within the scope of the presentdisclosure.

As shown, the memory bit cell 104-1 is disposed at an intersection of BL130 arranged along a first column and WL 138 arranged along a first row,the memory bit cell 104-2 is disposed at an intersection of BL 132arranged along a second column and the WL 138 arranged along the firstrow, the memory bit cell 104-3 is disposed at an intersection of BL 134arranged along a third column and the WL 138 arranged along the firstrow, the memory bit cell 104-4 is disposed at an intersection of BL 136arranged along a fourth column and the WL 138 arranged along the firstrow, the memory bit cell 104-5 is disposed at an intersection of the BL130 arranged along the first column and WL 140 arranged along a secondrow, the memory bit cell 104-6 is disposed at an intersection of the BL132 arranged along the second column and the WL 140 arranged along thesecond row, the memory bit cell 104-7 is disposed at an intersection ofthe BL 134 arranged along the third column and the WL 140 arranged alongthe second row, the memory bit cell 104-8 is disposed at an intersectionof the BL 136 arranged along the fourth column and the WL 140 arrangedalong the second row, the memory bit cell 104-9 is disposed at anintersection of the BL 130 arranged along the first column and WL 142arranged along a third row, the memory bit cell 104-10 is disposed at anintersection of the BL 132 arranged along the second column and the WL142 arranged along the third row, the memory bit cell 104-11 is disposedat an intersection of the BL 134 arranged along the third column and theWL 142 arranged along the third row, the memory bit cell 104-12 isdisposed at an intersection of the BL 136 arranged along the fourthcolumn and the WL 142 arranged along the third row, the memory bit cell104-13 is disposed at an intersection of the BL 130 arranged along thefirst column and WL 144 arranged along a fourth row, the memory bit cell104-14 is disposed at an intersection of the BL 132 arranged along thesecond column and the WL 144 arranged along the fourth row, the memorybit cell 104-15 is disposed at an intersection of the BL 134 arrangedalong the third column and the WL 144 arranged along the fourth row, thememory bit cell 104-16 is disposed at an intersection of the BL 136arranged along the fourth column and the WL 144 arranged along thefourth row.

Along the first row of the memory array 104A, the memory bit cells 104-1to 104-4 are coupled to a first component 104RM-1 of the row selectioncircuit 104RM through the WL 138; along the second row of the memoryarray 104A, the memory bit cells 104-5 to 104-8 are coupled to a secondcomponent 104RM-2 of the row selection circuit 104RM through the WL 140;along the third row of the memory array 104A, the memory bit cells 104-9to 104-12 are coupled to a third component 104RM-3 of the row selectioncircuit 104RM through the WL 142; and along the fourth row of the memoryarray 104A, the memory bit cells 104-13 to 104-16 are coupled to afourth component 104RM-4 of the row selection circuit 104RM through theWL 144. In some embodiments, each of the components 104RM-1 to 104RM-4may be implemented by any of a variety of pass gate transistors known inthe art that are configured to allow a signal to pass therethrough basedon a control signal such as, for example, a gated latch, a transmissiongate, etc.

Along the first column of the memory array 104A, the memory bit cells104-1, 104-5, 104-9, and 104-13 are coupled to a first component 104CM-1of the column selection circuit 104CM through the BL 130; along thesecond column of the memory array 104A, the memory bit cells 104-2,104-6, 104-10, and 104-14 are coupled to a second component 104CM-2 ofthe column selection circuit 104CM through the BL 132; along the thirdcolumn of the memory array 104A, the memory bit cells 104-3, 104-7,104-11, and 104-15 are coupled to a third component 104CM-3 of thecolumn selection circuit 104CM through the BL 134; and along the fourthcolumn of the memory array 104A, the memory bit cells 104-4, 104-8,104-12, and 104-16 are coupled to a fourth component 104CM-4 of thecolumn selection circuit 104CM through the BL 136. Similarly, in someembodiments, each of the components 104CM-1 to 104CM-4 may beimplemented by any of a variety of pass gate transistors that areconfigured to allow a signal to pass therethrough based on a controlsignal such as, for example, a gated latch, a transmission gate, etc.

Along the column direction, the memory bit cells are further coupled tothe write driver circuit 104WD through the respective BL. For example,along the first column of the memory array 104A, the memory bit cells104-1, 104-5, 104-9, and 104-13 are coupled to the write driver circuit104WD through the BL 130; along the second column of the memory array104A, the memory bit cells 104-2, 104-6, 104-10, and 104-14 are coupledto the write driver circuit 104WD through the BL 132; along the thirdcolumn of the memory array 104A, the memory bit cells 104-3, 104-7,104-11, and 104-15 are coupled to the write driver circuit 104WD throughthe BL 134; and along the fourth column of the memory array 104A, thememory bit cells 104-4, 104-8, 104-12, and 104-16 are coupled to thewrite driver circuit 104WD through the BL 136. In some embodiments, thewrite driver circuit 104WD may be implemented by a combination of plurallogic gates and/or transistors known in the art that is configured toprovide a write signal (e.g., a voltage signal) to an asserted BL.

Similar as the configuration of the memory bank 102, the memory bank 106includes memory bit cells 106-1, 106-2, 106-3, 106-4, 106-5, 106-6,106-7, 106-8, 106-9, 106-10, 106-11, 106-12, 106-13, 106-14, 106-15, and106-16, formed as an array 106A, that are each disposed at anintersection of a BL and WL, e.g., one of BL's 146, 148, 150, and 152and one of WL's 154, 156, 158, and 160, a row selection circuit 106RM, acolumn selection circuit 106CM, and a write driver circuit 106WD.Further, the row selection circuit 106RM also includes four components106RM-1, 106RM-2, 106RM-3, and 106RM-4 that are each coupled torespective memory bit cells of the memory array 106A through acorresponding WL; and the column selection circuit 106CM also includesfour components 106CM-1, 106CM-2, 106CM-3, and 106CM-4 that are eachcoupled to respective memory bit cells of the memory array 106A througha corresponding BL. The row selection circuit 106RM and column selectioncircuit 106CM, and write driver circuit 106WD are substantially similarto the above-described row selection circuit 104RM, column selectioncircuit 104CM, and write driver circuit 104WD, respectively, such thatdescriptions of the row selection circuit 106RM, column selectioncircuit 106CM, and write driver circuit 106WD are not repeated again.

Referring to FIG. 2B, the memory banks 108 and 110 are eachsubstantially similar to the memory banks 104 and 106 (FIG. 2A). Thus,the memory banks 108 and 110 are briefly described as follows. Forexample, the memory bank 108 includes memory bit cells 108-1, 108-2,108-3, 108-4, 108-5, 108-6, 108-7, 108-8, 108-9, 108-10, 108-11, 108-12,108-13, 108-14, 108-15, and 108-16, formed as an array 108A, that areeach disposed at an intersection of a BL and WL, e.g., one of BL's 162,164, 166, and 168 and one of WL's 170, 172, 174, and 176, a rowselection circuit 108RM, a column selection circuit 108CM, and a writedriver circuit 108WD; and the memory array 110 includes memory bit cells110-1, 110-2, 110-3, 110-4, 110-5, 110-6, 110-7, 110-8, 110-9, 110-10,110-11, 110-12, 110-13, 110-14, 110-15, and 110-16, formed as an array110A, that are each disposed at an intersection of a BL and WL, e.g.,one of BL's 178, 180, 182, and 184 and one of WL's 186, 188, 190, and192. Further, in the memory bank 108, the row selection circuit 108RMalso includes four components 108RM-1, 108RM-2, 108RM-3, and 108RM-4that are each substantially similar to the above-described components ofthe row selection circuit 104RM (FIG. 2A); and the column selectioncircuit 108CM also includes four components 108CM-1, 108CM-2, 108CM-3,and 108CM-4 that are each substantially similar to the above-describedcomponents of the column selection circuit 104CM (FIG. 2A). In thememory bank 110, the row selection circuit 110RM also includes fourcomponents 110RM-1, 110RM-2, 110RM-3, and 110RM-4 that are eachsubstantially similar to the above-described components of the rowselection circuit 104RM (FIG. 2A); and the column selection circuit110CM also includes four components 110CM-1, 110CM-2, 110CM-3, and110CM-4 that are each substantially similar to the above-describedcomponents of the column selection circuit 104CM (FIG. 2A).

As mentioned above, each component of the row selection circuits 104RM,106RM, 108RM, and 110RM is configured to allow a signal to passtherethrough based on a control signal, in accordance with someembodiments. More specifically, each component of the row selectioncircuits 104RM, 106RM, 108RM, and 110RM is configured to assert at leastone of the coupled WL's by allowing the signal to pass therethroughbased on address information indicated by the control signal that isprovided by the control logic circuit 102. Similarly, each component ofthe column selection circuits 104CM, 106CM, 108CM, and 110CM isconfigured to assert at least one of the coupled BL's also based on theabove-mentioned address information.

In some embodiments, such address information may include which of theWL's 138 to 144, 154 to 160, 170 to 176, and 186 to 192 and which of theBL's 130 to 136, 146 to 152, 162 to 168, and 178 to 184 to be asserted,respectively. Accordingly, the row selection circuit 104RM may assertone of the WL's 138 to 144 to allow the memory bit cells of the memoryarray 104A that are disposed along the asserted WL to be accessed (e.g.,read or written) by activating the corresponding component (e.g., one ofthe components 104RM-1 to 104RM-4); the row selection circuit 106RM mayassert one of the WL's 154 to 160 to allow the memory bit cells of thememory array 106A that are disposed along the asserted WL to be accessed(e.g., read or written) by activating the corresponding component (e.g.,one of the components 106RM-1 to 106RM-4); the row selection circuit108RM may assert one of the WL's 170 to 176 to allow the memory bitcells of the memory array 108A that are disposed along the asserted WLto be accessed (e.g., read or written) by activating the correspondingcomponent (e.g., one of the components 108RM-1 to 108RM-4); and the rowselection circuit 110RM may assert one of the WL's 186 to 192 to allowthe memory bit cells of the memory array 110A that are disposed alongthe asserted WL to be accessed (e.g., read or written) by activating thecorresponding component (e.g., one of the components 110RM-1 to110RM-4).

And, the column selection circuit 104CM may assert one of the BL's 130to 136 to allow the memory bit cells of the memory array 104A that aredisposed along the asserted BL to be accessed (e.g., read or written) byactivating the corresponding component (e.g., one of the components104CM-1 to 104CM-4); the column selection circuit 106CM may assert oneof the BL's 146 to 152 to allow the memory bit cells of the memory array106A that are disposed along the asserted BL to be accessed (e.g., reador written) by activating the corresponding component (e.g., one of thecomponents 106CM-1 to 106CM-4); the column selection circuit 108CM mayassert one of the BL's 162 to 168 to allow the memory bit cells of thememory array 108A that are disposed along the asserted BL to be accessed(e.g., read or written) by activating the corresponding component (e.g.,one of the components 108CM-1 to 108CM-4); and the column selectioncircuit 110RM may assert one of the BL's 178 to 184 to allow the memorybit cells of the memory array 110A that are disposed along the assertedBL to be accessed (e.g., read or written) by activating thecorresponding component (e.g., one of the components 110CM-1 to110CM-4).

FIG. 3 illustrates a flow chart of an exemplary method to rewrite one ormore failed data bits into respectively configured memory bit cellsbased on a unit of data word group, in accordance with variousembodiments. In various embodiments, the operations of the method 300are performed by the respective components illustrated in FIGS. 1-2B.For purposes of discussion, the following embodiment of the method 300will be described in conjunction with FIGS. 1-2B. The illustratedembodiment of the method 300 is merely an example. Therefore, it shouldbe understood that any of a variety of operations may be omitted,re-sequenced, and/or added while remaining within the scope of thepresent disclosure.

The method 300 starts with operation 302 in which a first plurality ofdata words, each of which includes a plurality of data bits, are writteninto respective memory bit cells. In some embodiments, the respectivenumbers of the data bits of the data words may be equal to or differentfrom each other.

For example, the control logic circuit 102 may receive 5 data words:1^(st) data word, 2^(nd) data word, 3^(rd) data word, 4^(th) data word,5^(th) data word, each of which has plural data bits (e.g., 4 data bitsfor purposes of simplicity). Further, as mentioned above, when thecontrol logic circuit 102 receives the 5 data words, each of the databits of the 5 data words may be associated with a corresponding logicaladdress that can be mapped to a physical address (i.e., at whichintersection of a BL and WL) of one the memory bit cells of the memoryarrays 104A-110A. The control logic circuit 102 then writes the databits of the 5 data words into the memory bit cells using the respectivelogical addresses.

More specifically, the 4 data bits of the 1^(st) data word may berespectively configured to be written into the memory bit cells 104-1,104-2, 104-3, and 104-4 of the memory array 104A (as indicated in FIG.2A); the 4 data bits of the 2^(nd) data word may be respectivelyconfigured to be written into the memory bit cells 108-5, 108-6, 108-7,and 108-8 of the memory array 108A (as indicated in FIG. 2B); the 4 databits of the 3^(rd) data word may be respectively configured to bewritten into the memory bit cells 108-9, 108-10, 108-11, and 108-12 ofthe memory array 108A (as indicated in FIG. 2B); the 4 data bits of the4^(th) data word may be respectively configured to be written into thememory bit cells 110-9, 110-10, 110-11, and 110-12 of the memory array110 (as indicated in FIG. 2B); the 4 data bits of the 5^(th) data wordmay be respectively configured to be written into the memory bit cells110-13, 110-14, 110-15, and 110-16 of the memory array 110 (as indicatedin FIG. 2B).

Accordingly, the control logic circuit 102 may cause the row selectioncircuit 104RM to activate the component 104RM-1 so as to assert the WL138, and cause the column selection circuit 104CM to respectively orcollectively activate the components 104CM-1 to 104CM-4 so as to assertthe BL's 130 to 136 such that the data bits of the 1 ^(st) data word canbe written into the memory bit cells 104-1 to 104-4, respectively.Similarly, the control logic circuit 102 may cause the row selectioncircuit 108RM to activate the component 108RM-2 so as to assert the WL172, and cause the column selection circuit 108CM to respectively orcollectively activate the components 108CM-1 to 108CM-4 so as to assertthe BL's 162 to 168 such that the data bits of the 2^(nd) data word canbe written into the memory bit cells 108-5 to 108-8, respectively; thecontrol logic circuit 102 may cause the row selection circuit 108RM toactivate the component 108RM-3 so as to assert the WL 174, and cause thecolumn selection circuit 108CM to respectively or collectively activatethe components 108CM-1 to 108CM-4 so as to assert the BL's 162 to 168such that the data bits of the 3^(rd) data word can be written into thememory bit cells 108-9 to 108-12, respectively; the control logiccircuit 102 may cause the row selection circuit 110RM to activate thecomponent 110RM-3 so as to assert the WL 190, and cause the columnselection circuit 110CM to respectively or collectively activate thecomponents 110CM-1 to 110CM-4 so as to assert the BL's 178 to 184 suchthat the data bits of the 4^(th) data word can be written into thememory bit cells 110-9 to 110-12, respectively; the control logiccircuit 102 may cause the row selection circuit 110RM to activate thecomponent 110RM-4 so as to assert the WL 192, and cause the columnselection circuit 110CM to respectively or collectively activate thecomponents 110CM-1 to 110CM-4 so as to assert the BL's 178 to 184 suchthat the data bits of the 5^(th) data word can be written into thememory bit cells 110-13 to 110-16, respectively.

The method 300 continues to operation 304 to determine whether all thedata bits of the first plurality of data words are correctly writteninto the respective memory bit cells. Continuing with the above example,subsequently to writing all the data bits of the 1^(st) to 5^(th) datawords into the respective configured memory bit cells, the control logiccircuit 102 may follow the same operations as described above to assertthe respective WL's and BL's of the memory bit cells that are writtenwith the 1^(st) to 5^(th) data words, and use one or more coupledsensing amplifiers (not shown) to read out the written data bits.Further, in some embodiments, the control logic circuit 102 may comparethe respective logical states of the data bits of the 1^(st) to 5^(th)data words that the control logic circuit 102 intends to write into thememory bit cells (i.e., the respective logical states of the data bitsof the 1^(st) to 5^(th) data words that the control logic circuit 102received in operation 302) with the logical states read out from thememory bit cells. In some embodiments, when all the read-out logicalstates of the data bits of the 1^(st) to 5^(th) data words match therespective intended logical states (i.e., all the data bits of the firstplurality of data words are correctly written into the respective memorybit cells), the method 300 proceeds to operation 306 in which the writeoperation ends.

On the other hand, when the read-out logical states of one or more ofthe data bits of the 1^(st) to 5^(th) data words do not match therespective intended logical states, such data bits may be categorized,by the control logic circuit 102, as failed data bits, as mentionedabove. In this case (i.e., not all the data bits of the first pluralityof data words are correctly written into the respective memory bitcells), the method 300 proceeds to operation 308 in which information ofsuch failed data bits are recorded into a buffer circuit. In someembodiments, the aforementioned information of failed data bits mayinclude which of the data words each failed data bit belongs to and amapping of such failed data bits. The mapping may include where (i.e.,which physical address) each of the failed data bits is configured to bewritten.

Continuing with the above example, after performing the comparison inoperation 304, the control logic circuit 102 may determine that the3^(rd) data bit of the 1^(st) data word, the 3^(rd) data bit of the2^(nd) data word, the 3^(rd) data bit of the 3^(rd) data word, and the1^(st) data bit of the 4^(th) data word are failed data bits. In otherwords, except for the 5^(th) data word, each data word has one faileddata bit, accordingly, the control logic circuit 102 records suchinformation indicating which of the 5 data words has failed data bitsinto the buffer circuit 120. Subsequently to or simultaneously withidentifying the failed data bits, the control logic circuit 102 mayfurther record the respective physical addresses of memory bit cellswhere the failed data bits were written into the buffer circuit 120. Forexample, the control logic circuit 102 may record the 3^(rd) data bit ofthe 1^(st) data word was written to the memory bit cell 104-3 located atthe intersection of the third column (BL 134) and first row (WL 138) ofthe memory array 104A; the 3^(rd) data bit of the 2^(nd) data word waswritten to the memory bit cell 108-7 at the intersection of the thirdcolumn (BL 166) and second row (WL 172) of the memory array 108A; the3^(rd) data bit of the 3^(rd) data word was written to the memory bitcell 108-11 at the intersection of the third column (BL 166) and thirdrow (WL 174) of the memory array 108A; and the 1^(st) data bit of the4^(th) data word was written to the memory bit cell 110-9 at theintersection of the first column (BL 178) and third row (WL 190) of thememory array 110A.

Referring again to FIG. 3, after determining not all the data bits ofthe first plurality of data words are correctly written into therespective memory bit cells and recording respective information of thefailed data bits (operations 304 and 308), the method 300 continues tooperation 310 in which the first plurality of data words are grouped asa second plurality of data word sets. If the number of the firstplurality of data words can be divided by the size with no remainder,each data word set may have an equally divided number of data words. Onthe other hand, if the number of the first plurality of data wordscannot be divided by the size with no remainder, every data word set,except for a last word set, may have an equally divided number of datawords.

Continuing with the above example, the control logic circuit 102 maydetermine the size of the data word set as 2, which reflects the lattercase discussed above. As such, the control logic circuit 102 may groupthe 1^(st) and 2^(nd) data words as a first data word set; the 3^(rd)and 4^(th) data words as a second data word set; and the 5^(th) dataword as a third word set. In some embodiments, the control logic circuit102 may rewrite the failed data bits in each data word set following therespective orders, i.e., rewriting the first data word set, the seconddata word set, and then the third data word set, which will be discussedin further detail below. As such, the third data word set may beregarded as the last data word set of the plural data word sets.However, it is understood that the control logic circuit 102 may notfollow the orders to rewrite the failed data bits while remaining withinthe scope of the present disclosure.

In some alternative embodiments, upon determining the size of the dataword set, the control logic circuit 102 may group the data words thathave failed data bits as a same, or first, data word set, and prioritizeto rewrite the failed data bits contained in such a first data word set.In an example where among 1^(st) to 5^(th) data words, only the 1^(st)and 4^(th) data words have failed data bits, the control logic circuit102 may group the 1^(st) and 4^(th) data words as a first data word set;the 2^(nd) and 3^(rd) data words, which do not have any failed databits, as a second data word set; and the 5^(th) data word, which doesnot have any failed data bits, as a third data word set. And, thecontrol logic circuit 102 may prioritize to rewrite the failed data bitscontained in the first data word set.

The method 300 continues to operation 312 in which a first data word setis selected. In some embodiments, after grouping the first plurality ofdata words, the control logic circuit 102 may first select a data wordset by its order, as mentioned above. In the above example, the controllogic circuit 102 may select the first data word set that includes the1^(st) and 2^(nd) data words.

The method 300 continues to operation 314 to determine whether theselected data word set contains any of the failed data bits. Continuingwith the above example, the control logic circuit 102 may determinewhether the selected data word set (e.g., the first data word set thatincludes the 1^(st) and 2^(nd) data words) by accessing the buffercircuit 120 since in operation 308, the control logic circuit 102 storesthe information of all the failed data bits in the buffer circuit 120.

According to some embodiments, in determination operation 314, if theselected data word set contains one or more of the failed data bits, themethod 300 proceeds to operation 316 in which the failed data bit(s)contained in the selected data word set are respectively rewritten intothe respective configured memory bit cells, and then to operation 318 tofurther determine whether the selected data word set is the last dataword set of the second plurality of data word sets. If the selected dataword set is the last one of the second plurality of data word sets, themethod 300 proceeds again to operation 304 to determine whether all thedata bits of the first plurality of data words are correctly writteninto the respective memory bit cells. Or, if the selected data word setis not the last one of the second plurality of data word sets, themethod 300 proceeds to operation 320 in which a next data word set isselected, and then loops back to operation 314.

On the other hand, in determination operation 314, if the selected dataword set contains none of the failed data bits, the method 300 skipsoperation 316 and directly proceeds to operation 318 to furtherdetermine whether the selected data word set is the last data word setof the second plurality of data word sets. Similarly, if the selecteddata word set is the last one of the second plurality of data word sets,the method 300 proceeds again to operation 304 to determine whether allthe data bits of the first plurality of data words are correctly writteninto the respective memory bit cells. Or, if the selected data word setis not the last one of the second plurality of data word sets, themethod 300 proceeds to operation 320 in which a next data word set isselected, and then loops back to operation 314.

As such, one or more iteration loops may be formed while performing themethod 300, for example, a first iteration loop starting from operation314, going through operations 316, 318, and 320, and returning tooperation 314, a second iteration loop starting from operation 314,going through operations 316, 318, 304, 308, 310, and 312, and returningto operation 314, a third iteration loop starting from operation 314,going through operations 318 and 320, and returning to operation 314,and a fourth iteration loop starting from operation 314, going throughoperations 318, 304, 308, 310, and 312, and returning to operation 314.Operations 316, 318, and 320 will be respectively described in furtherdetail below.

In the above example in which the first data word set including the1^(st) and 2^(nd) data words is selected (operation 312), since both the1^(st) and 2^(nd) data words have at least one of the failed data bits(operation 314), in operation 316, the control logic circuit 102 mayconcurrently rewrite the failed data bits, which were respectivelyincluded in the 1^(st) and 2^(nd) data words but are now groupedtogether in the first data word set, to respective configured memory bitcells, in accordance with some embodiments. More specifically, the1^(st) data word has one failed data bit that was written to the memorybit cell 104-3 of the memory array 104A, and the 2^(nd) data word hasone failed data bit that was written to the memory bit cell 108-4 of thememory array 108. In some embodiments, the control logic circuit 102 mayconcurrently assert the WL 138 by activating the component 104RM-1 toallow the access of the memory bit cell 104-3, and the WL 172 byactivating the component 108RM-2 to allow the access of the memory bitcell 108-7. Concurrently or subsequently, the control logic circuit 102asserts the BL 134 by activating the component 104CM-3 to cause thewrite driver circuit 104WD to rewrite the intended logical state of the3^(rd) data bit of the 1^(st) data word to the memory bit cell 104-3,and the BL 166 by activating the component 108CM-3 to cause the writedriver circuit 108WD to rewrite the intended logical state of the 3^(rd)data bit of the 3^(rd) data word to the memory bit cell 108-7.

In operation 318, the control logic circuit 102 checks whether theselected first data word set including the 1^(st) and 2^(nd) data wordsis the last one of the plural data word sets. In the current example,the last data word set should be the third data word set that includesthe 5^(th) data word, so the method 300 proceed to operation 320 toselect a next data word set, which is the second data word set thatincludes the 3^(rd) and 4^(th) data words. The method 300 then loopsback to operation 314 to determine whether the second data word setinclude any of the failed data bits. Since the both the 3^(rd) and4^(th) data words have at least one of the failed data bits (asdescribed above), the control logic circuit 102 may follow the principledescribed above to concurrently rewrite the failed data bits, which wererespectively included in the 3^(rd) and 4^(th) data words but are nowgrouped together in the second data word set, to respective configuredmemory bit cells 108-11 and 110-9, and checks whether the selectedsecond data word set including the 3^(rd) and 4^(th) data words is thelast one of the plural data word sets. In the current example, thesecond data word set is still not the last data word set so the method300 proceed to operation 320 to select a next data word set, the thirddata word set that includes the 5^(th) data word, and then loops back tooperation 314. Since the third data word set does not contain any faileddata bit, the method 300 directly proceeds to operation 318, and sincethe third data word set is the last data word set (as determined inoperation 318), the method 300 then proceeds again to operation 304 todetermine whether all the data bits of the 1^(st) to 5^(th) data wordsare correctly written into the respective configured memory bit cells.Similarly, if all the data bits of the 1^(st) to 5^(th) data words arecorrectly written into the respective configured memory bit cells, thewrite operation ends (operation 306); and if there is still one or morefailed data bits, such failed data bits will be rewritten followingoperation 308-312, and selectively following the iteration loop ofoperations 314, 316, 318, 320, and 314, the iteration loop of operations314, 318, 320, and 314, or the iteration loop of operations 314, 316,318, 304, 308, 310, 312, and 314.

FIG. 4 is a block diagram of a computer system 400 in accordance withsome embodiments. One or more of the circuits and/or engines and/orsystems and/or operations described with respect to FIGS. 1-3 isrealized in some embodiments by one or more computer systems 400 of FIG.4. The system 400 comprises at least one processor 401, a memory 402, anetwork interface (I/F) 406, an input/output (I/O) device 408, and astorage 410 communicatively coupled via a bus 404 or otherinterconnection communication mechanism.

The memory 402 comprises, in some embodiments, a random access memory(RAM) and/or other dynamic storage device and/or read only memory (ROM)and/or other static storage device, coupled to the bus 404 for storingdata and/or instructions to be executed by the processor 401. The memory402 can further include a userspace 412, kernel 414, portions of thekernel and/or the userspace, and components thereof. The memory 402 isalso used, in some embodiments, for storing temporary variables or otherintermediate information during execution of instructions to be executedby the processor 401. In various embodiments, the memory 402 can becontained within a single integrated circuit or comprise a plurality ofdiscrete memory devices operatively coupled to one another.

In some embodiments, a storage device 410, such as a magnetic disk oroptical disk, is coupled to the bus 404 for storing data and/orinstructions. The I/O device 408 comprises an input device, an outputdevice and/or a combined input/output device for enabling userinteraction with the system 400. An input device comprises, for example,a keyboard, keypad, mouse, trackball, trackpad, and/or cursor directionkeys for communicating information and commands to the processor 401. Anoutput device comprises, for example, a display, a printer, a voicesynthesizer, etc. for communicating information to a user.

In some embodiments, one or more operations and/or functionality of thecircuits and/or engines and/or systems described with respect to FIGS.1-3 are realized by the processor 401, which is programmed forperforming such operations and/or functionality. In some embodiments,the processor 401 is configured as specifically configured hardware(e.g., one or more application specific integrated circuits (ASICs)). Inaccordance with various embodiments, the processor 401 may beimplemented within a single integrated circuit (IC) or as multiplecommunicatively coupled IC's and/or discrete circuits. It is appreciatedthat the processor 401 can be implemented in accordance with variousknown technologies. In one embodiment, the processor 401 includes one ormore circuits or units configurable to perform one or more functions orprocesses described herein by executing instructions stored in anassociated memory, for example. In other embodiments, the processor 401may be implemented as firmware (e.g., discrete logic components)configured to perform one or more functions or processes describedherein. For example, in accordance with various embodiments, theprocessor 401 may include one or more controllers, microprocessors,microcontrollers, application specific integrated circuits (ASICs),digital signal processors, programmable logic devices, fieldprogrammable gate arrays, or any combination of these devices orstructures, or other known devices and structures, to perform thefunctions described herein.

One or more of the memory 402, the I/F 406, the storage 410, the I/Odevice 408, and the bus 404 is/are operable to receive instructions,data, design constraints, design rules, netlists, layouts, models and/orother parameters for processing by the processor 401.

In some embodiments, the operations and/or functionality are realized asfunctions of a program stored in a non-transitory computer readablerecording medium. In at least one embodiment, the operations and/orfunctionality are realized as functions of a program, such as a set ofexecutable instructions, stored in memory 402. In at least oneembodiment, an IC design is stored in a non-transitory computer readablerecording medium for access by one or more operations as describedherein. Examples of a non-transitory computer readable recording mediuminclude, but are not limited to, external/removable and/orinternal/built-in storage or memory unit, e.g., one or more of anoptical disk, such as a DVD, a magnetic disk, such as a hard disk, asemiconductor memory, such as a ROM, a RAM, a memory card, and the like.

In an embodiment, a method includes: writing a plurality of data words,each of which has a plurality of data bits, into respective bit cells ofa memory device; in response to determining that not all the data bitsof the plurality of data words are correctly written into the respectivebit cells of the memory device, grouping the plurality of data words asa plurality of data word sets; and simultaneously rewriting a subset ofdata bits that were not correctly written into the respective bit cellsof the memory device, wherein the subset of the data bits are containedin a respective one of the plurality of data word sets.

In another embodiment, a method includes: writing a plurality of datawords, each of which has a plurality of data bits, into respective bitcells of a memory device; verifying whether all the data bits of theplurality of data words are correctly written into the respective bitcells of the memory device; in response to a presence of one or moredata bits of the plurality of data words that are not correctly writteninto the respective bit cells of the memory device, grouping theplurality of data words as a plurality of data word sets; anditeratively rewriting at least one of the one or more data bits that iscontained in a respective one of the plurality of data word sets intothe respective bit cell of the memory device until all the data bits ofthe plurality of data words are verified to be correctly written intothe respective bit cells of the memory device.

In yet another embodiment, a memory device includes: a plurality ofmemory bit cells; and a control logic circuit, coupled to the pluralityof memory bit cells. The control logic circuit is configured to: write aplurality of data words, each of which has a plurality of data bits,into respective ones of the plurality of memory bit cells; verifywhether all the data bits of the plurality of data words are correctlywritten into the respective memory bit cells; in response to a presenceof one or more data bits of the plurality of data words that are notcorrectly written into the respective memory bit cells, group theplurality of data words as a plurality of data word sets; anditeratively rewrite at least one of the one or more data bits that iscontained in a respective one of the plurality of data word sets intothe respective memory bit cell until all the data bits of the pluralityof data words are verified to be correctly written into the respectivememory bit cells.

The foregoing outlines features of several embodiments so that thoseordinary skilled in the art may better understand the aspects of thepresent disclosure. Those skilled in the art should appreciate that theymay readily use the present disclosure as a basis for designing ormodifying other processes and structures for carrying out the samepurposes and/or achieving the same advantages of the embodimentsintroduced herein. Those skilled in the art should also realize thatsuch equivalent constructions do not depart from the spirit and scope ofthe present disclosure, and that they may make various changes,substitutions, and alterations herein without departing from the spiritand scope of the present disclosure.

What is claimed is:
 1. A method, comprising: writing a plurality of datawords, each of which has a plurality of data bits, into respective bitcells of a memory device; in response to determining that not all thedata bits of the plurality of data words are correctly written into therespective bit cells of the memory device, grouping the plurality ofdata words as a plurality of data word sets; and simultaneouslyrewriting a subset of data bits that were not correctly written into therespective bit cells of the memory device, wherein the subset of thedata bits are contained in a respective one of the plurality of dataword sets.
 2. The method of claim 1, wherein at least a subset of theplurality of data word sets have a common number of data words.
 3. Themethod of claim 1, wherein at least a subset of the plurality of dataword sets have respective different numbers of data words.
 4. The methodof claim 1, further comprising: storing respective addresses associatedwith the data bits that were not correctly written into the respectivebit cells of the memory device into one or more buffers of the memorydevice.
 5. The method of claim 4, further comprising: accessing the oneor more buffers to determine whether a first one of the plurality ofdata word sets includes any of the data bits that were not correctlywritten into the respective bit cells of the memory device.
 6. Themethod of claim 5, further comprising: in response to the first one ofthe plurality of data word sets including a first subset of the databits that were not correctly written into the respective bit cells intothe respective bit cells of the memory device, rewriting the firstsubset of the data bits into the respective bit cell of the memorydevice and then determining whether the first one of the plurality ofdata word sets is a last one of the plurality of data word sets; and inresponse to the first one of the plurality of data word sets includingnone of the data bits that were not correctly written into therespective bit cells into the respective bit cells of the memory device,determining whether the first one of the plurality of data word sets isthe last one of the plurality of data word sets.
 7. The method of claim6, further comprising: in response to the first one of the plurality ofdata word sets not being the last one of the plurality of data wordsets, determining whether a second one of the plurality of data wordsets includes any of the data bits that were not correctly written intothe respective bit cells into the respective bit cells of the memorydevice, and in response, selectively rewriting a second subset of thedata bits that contained in the second one of the plurality of data wordsets into the respective bit cell of the memory device; and in responseto the first one of the plurality of data word sets being the last oneof the plurality of data word sets, verifying whether all the data bitsof the plurality of data words are correctly written into the respectivebit cells of the memory device.
 8. A method, comprising: writing aplurality of data words, each of which has a plurality of data bits,into respective bit cells of a memory device; verifying whether all thedata bits of the plurality of data words are correctly written into therespective bit cells of the memory device; in response to a presence ofone or more data bits of the plurality of data words that are notcorrectly written into the respective bit cells of the memory device,grouping the plurality of data words as a plurality of data word sets;and iteratively rewriting at least one of the one or more data bits thatis contained in a respective one of the plurality of data word sets intothe respective bit cell of the memory device until all the data bits ofthe plurality of data words are verified to be correctly written intothe respective bit cells of the memory device.
 9. The method of claim 8,wherein at least a subset of the plurality of data word sets have acommon number of data words.
 10. The method of claim 8, wherein at leasta subset of the plurality of data word sets have respective differentnumbers of data words.
 11. The method of claim 8, further comprising:storing respective addresses associated with the one or more data bitsthat were not correctly written into the respective bit cells into therespective bit cells of the memory device into one or more buffers ofthe memory device.
 12. The method of claim 11, further comprising:accessing the one or more buffers to determine whether a first one ofthe plurality of data word sets includes any of the one or more databits that were not correctly written into the respective bit cells intothe respective bit cells of the memory device.
 13. The method of claim12, further comprising: when the first one of the plurality of data wordsets includes at least a first one of the one or more data bits thatwere not correctly written into the respective bit cells into therespective bit cells of the memory device, rewriting the at least firstone of the one or more data bits into the respective bit cell of thememory device; and determining whether the first one of the plurality ofdata word sets is a last one of the plurality of data word sets.
 14. Themethod of claim 13, further comprising: when the first one of theplurality of data word sets is not the last one of the plurality of dataword sets, iteratively determining whether a next one of the pluralityof data word sets includes any of the one or more data bits that werenot correctly written into the respective bit cells into the respectivebit cells of the memory device and in response, selectively rewriting atleast one of the one or more data bits contained in the next one of theplurality of data word sets into the respective bit cell of the memorydevice until the next one of the plurality of data word sets is the lastone of the plurality of data word sets; and verifying again whether allthe data bits of the plurality of data words are correctly written intothe respective bit cells of the memory device.
 14. The method of claim12, further comprising: when the first one of the plurality of data wordsets does include any of the one or more data bits that were notcorrectly written into the respective bit cells into the respective bitcells of the memory device, determining whether the first one of theplurality of data word sets is a last one of the plurality of data wordsets.
 15. The method of claim 14, further comprising: when the first oneof the plurality of data word sets is not the last one of the pluralityof data word sets, iteratively determining whether a next one of theplurality of data word sets includes any of the one or more data bitsthat were not correctly written into the respective bit cells into therespective bit cells of the memory device and in response, selectivelyrewriting at least one of the one or more data bits contained in thenext one of the plurality of data word sets into the respective bit cellof the memory device until the next one of the plurality of data wordsets is the last one of the plurality of data word sets; and verifyingagain whether all the data bits of the plurality of data words arecorrectly written into the respective bit cells of the memory device.16. A memory device, comprising: a plurality of memory bit cells; and acontrol logic circuit, coupled to the plurality of memory bit cells, andconfigured to: write a plurality of data words, each of which has aplurality of data bits, into respective ones of the plurality of memorybit cells; verify whether all the data bits of the plurality of datawords are correctly written into the respective memory bit cells; inresponse to a presence of one or more data bits of the plurality of datawords that are not correctly written into the respective memory bitcells, group the plurality of data words as a plurality of data wordsets; and iteratively rewrite at least one of the one or more data bitsthat is contained in a respective one of the plurality of data word setsinto the respective memory bit cell until all the data bits of theplurality of data words are verified to be correctly written into therespective memory bit cells.
 17. The memory device of claim 16, whereinthe control logic circuit is further configured to: determine whether afirst one of the plurality of data word sets includes any of the one ormore data bits that were not correctly written into the respectivememory bit cells.
 18. The memory device of claim 17, wherein when thefirst one of the plurality of data word sets includes at least a firstone of the one or more data bits that were not correctly written intothe respective memory bit cells, the control logic circuit is furtherconfigured to: rewrite the at least first one of the one or more databits into the respective memory bit cell; and determine whether thefirst one of the plurality of data word sets is a last one of theplurality of data word sets.
 19. The memory device of claim 18, whereinwhen the first one of the plurality of data word sets is not the lastone of the plurality of data word sets, the control logic circuit isfurther configured to: iteratively determine whether a next one of theplurality of data word sets includes any of the one or more data bitsthat were not correctly written into the respective memory bit cells andin response, selectively rewrite at least one of the one or more databits contained in the next one of the plurality of data word sets intothe respective memory bit cell until the next one of the plurality ofdata word sets is the last one of the plurality of data word sets; andverify again whether all the data bits of the plurality of data wordsare correctly written into the respective memory bit cells.
 20. Thememory device of claim 17, wherein when the first one of the pluralityof data word sets does include any of the one or more data bits thatwere not correctly written into the respective memory bit cells, thecontrol logic circuit is further configured to: determine whether thefirst one of the plurality of data word sets is a last one of theplurality of data word sets, when the first one of the plurality of dataword sets is not the last one of the plurality of data word sets,iteratively determine whether a next one of the plurality of data wordsets includes any of the one or more data bits that were not correctlywritten into the respective memory bit cells, in response, selectivelyrewrite at least one of the one or more data bits contained in the nextone of the plurality of data word sets into the respective memory bitcell until the next one of the plurality of data word sets is the lastone of the plurality of data word sets, and verify again whether all thedata bits of the plurality of data words are correctly written into therespective memory bit cells.